Department of Electrical and Electronic Engineering, National Defense Academy of Japan

Name Professor Dr. Tetsushi YUGE
Field Computer and Information Engineering
  • Introduction to Computer Science
  • Applied Computer Science
  • Exercise of Electric Circuit
Research interests
  • Top event probability of dynamic fault trees
  • Reliability analysis of consecutive system
  • Reliability of multistate systems
Key words
  • Dynamic fault tree
  • RAM
  • Safety
  • Consecutive system
  • Dynamic fault tree analysis using Bayesian networks and sequence probabilities (IEICE Trans. Fundamentals, E96-A, 5, 2013)
  • Quantitative analysis of a fault tree with priority AND gates (Reliability Engineering and System Safety, 93, 11, 2008)
  • Reliability of a 2-dimensional lattice system subject to dependent component failure (IEICE Trans. Fundamentals, E89-A, 8 , 2006)

Last Modified: 31 October, 2014 by ml-eeweb